|
±`¥Î¤¤^对·Ó«D¯}Ãa检测词汇1000条 |
|
|
^
¤å |
¤¤
¤å |
|
A.C magnetic saturation |
¥æ¬yºÏ饱©M |
|
Absorbed dose |
§l¦¬剂¶q |
|
Absorbed dose rate |
§l¦¬剂¶q²v |
|
Acceptanc limits |
验¦¬S围 |
|
Acceptance level |
验¦¬¤ô¥ |
|
Acceptance standard |
验¦¬标ã |
|
Accumulation test |
²Ö积检测 |
|
Acoustic emission count¡]emission count¡^ |
声发®g计数¡]发®g计数¡^ |
|
Acoustic emission transducer |
声发®g换¯à¾¹¡]声发®g传·P¾¹¡^ |
|
Acoustic emission(AE) |
声发®g |
|
Acoustic holography |
声¥þ®§术 |
|
Acoustic impedance |
声ªý§Ü |
|
Acoustic impedance matching |
声ªý§Ü¤Ç°t |
|
Acoustic impedance method |
声ªýªk |
|
Acoustic wave |
声ªi |
|
Acoustical lens |
声³z镜 |
|
Acoustic¡Xultrasonic |
声-¶W声¡]AU¡^ |
|
Activation |
¬¡¤Æ |
|
Activity |
¬¡«× |
|
Adequate shielding |
¦w¥þ«Ì½ª |
|
Ampere turns |
¦w¥`数 |
|
Amplitude |
´T«× |
|
Angle beam method |
±×®gªk |
|
Angle of incidence |
¤J®g¨¤ |
|
Angle of reflection |
¤Ï®g¨¤ |
|
Angle of spread |
«ü¦V¨¤ |
|
Angle of squint |
°¾¦V¨¤ |
|
Angle probe |
±×±´头 |
|
Angstrom unit |
®J(A) |
|
Area amplitude response curve |
±积´T«×¦±线 |
|
Area of interest |
评©w区 |
|
Arliflcial disconlinuity |
¤H¤u¤£连续©Ê |
|
Artifact |
°²¯Ê³´ |
|
Artificial defect |
¤H¤u¯Ê³´ |
|
Artificial discontinuity |
标ã¤H¤u¯Ê³´ |
|
A-scan |
A«¬扫´y |
|
A-scope; A-scan |
A«¬显¥Ü |
|
Attenuation coefficient |
°I减¨t数 |
|
Attenuator |
°I减¾¹ |
|
Audible leak indicator |
µ响ªnº|«ü¥Ü¾¹ |
|
Automatic testing |
¦Û动检测 |
|
Autoradiography |
¦Û®g线·Ó¤ù |
|
Avaluation |
评©w |
|
Barium concrete |
钡²V¾®¤g |
|
Barn |
¹v |
|
Base fog |
¤ù°ò¦Ç雾 |
|
|
¼Ñ²G |
|
Bayard- Alpert ionization gage |
B- A«¬电ÖÃ计 |
|
Beam |
声§ô |
|
Beam ratio |
¥ú§ô¤ñ |
|
Beam angle |
§ô张¨¤ |
|
Beam axis |
声§ô轴线 |
|
Beam index |
声§ô¤J®g点 |
|
Beam path location |
声µ{©w¦ì |
|
Beam path; path length |
声µ{ |
|
Beam spread |
声§ô扩´² |
|
Betatron |
电¤l·P应¥[³t¾¹ |
|
Bimetallic strip gage |
双ª÷属¤ù计 |
|
Bipolar field |
双ÌåºÏ场 |
|
Black light filter |
¶Â¥ú滤ªi¾¹ |
|
Black light; ultraviolet radiation |
¶Â¥ú |
|
Blackbody |
¶ÂÊ^ |
|
Blackbody equivalent temperature |
¶ÂÊ^µ¥®Ä温«× |
|
Bleakney mass spectrometer |
ªi§Q§J¥§质谱仪 |
|
Bleedout |
渗¥X |
|
Bottom echo |
©³±¦^ªi |
|
Bottom surface |
©³± |
|
Boundary echo(first) |
边¬É¤@¦¸¦^ªi |
|
Bremsstrahlung |
轫P辐®g |
|
Broad-beam condition |
宽®g§ô |
|
Brush application |
¨êÒ\ |
|
B-scan presenfation |
B«¬扫´y显¥Ü |
|
B-scope; B-scan |
B«¬显¥Ü |
|
C- scan |
C«¬扫´y |
|
Calibration,instrument |
设备®Õã |
|
Capillary action |
¤ò细ºÞ§@¥Î |
|
Carrier fluid |
载²G |
|
Carry over of penetrate |
渗³z剂²¾转 |
|
Cassette |
·t¦X |
|
Cathode |
阴Ìå |
|
Central conductor |
¤¤¤ß导Ê^ |
|
Central conductor method |
¤¤¤ß导Ê^ªk |
|
Characteristic curve |
¯S©Ê¦±线 |
|
Characteristic curve of film |
胶¤ù¯S©Ê¦±线 |
|
Characteristic radiation |
¯S©º辐®g |
|
Chemical fog |
¤Æ学¦Ç雾 |
|
Cine-radiography |
®g线(¬¡动)电¼v摄¼v术 |
|
Cintact pads |
±µàD垫 |
|
Circumferential coils |
圆环线°é |
|
Circumferential field |
©P¦VºÏ场 |
|
Circumferential magnetization method |
©P¦VºÏ¤Æªk |
|
Clean |
²M²z |
|
Clean- up |
²M°£ |
|
Clearing time |
©w³z时间 |
|
Coercive force |
矫顽¤O |
|
Coherence |
¬Û¤z©Ê |
|
Coherence length |
¬Û¤z长«×¡]谐ªi¦C长«×¡^ |
|
Coi1¡Atest |
测试线°é |
|
Coil size |
线°é¤j¤p |
|
Coil spacing |
线°é间¶Z |
|
Coil technique |
线°é§Þ术 |
|
Coil method |
线°éªk |
|
Coilreference |
线°é参¦Ò |
|
Coincidence discrimination |
²Å¦X鉴别 |
|
Cold-cathode ionization gage |
§N阴Ìå电ÖÃ计 |
|
Collimator |
㪽¾¹ |
|
Collimation |
㪽 |
|
Collimator |
㪽¾¹ |
|
Combined colour comtrast and fluorescent penetrant |
着¦â荧¥ú渗³z剂 |
|
Compressed air drying |
压缩ªÅÉa¤zÀê |
|
Compressional wave |
压缩ªi |
|
|
±d´¶顿´²®g |
|
Continuous emission |
连续发®g |
|
Continuous linear array |
连续线阵 |
|
Continuous method |
连续ªk |
|
Continuous spectrum |
连续谱 |
|
Continuous wave |
连续ªi |
|
Contract stretch |
对¤ñ«×宽 |
|
Contrast |
对¤ñ«× |
|
Contrast agent |
对¤ñ剂 |
|
Contrast aid |
¤Ï®t剂 |
|
Contrast sensitivity |
对¤ñ灵±Ó«× |
|
Control echo |
监视¦^ªi |
|
Control echo |
参¦Ò¦^ªi |
|
Couplant |
½¢¦X剂 |
|
Coupling |
½¢¦X |
|
Coupling losses |
½¢¦X损¥¢ |
|
Cracking |
µõ¸Ñ |
|
Creeping wave |
ª¦ªi |
|
Critical angle |
临¬É¨¤ |
|
Cross section |
横ºI± |
|
Cross talk |
¦êµ |
|
Cross-drilled hole |
横¤Õ |
|
|
´¹¤ù |
|
C-scope; C-scan |
C«¬显¥Ü |
|
Curie point |
©~¨½点 |
|
Curie temperature |
©~¨½温«× |
|
Curie(Ci) |
©~¨½ |
|
Current flow method |
³q电ªk |
|
Current induction method |
电¬y·P应ªk |
|
Current magnetization method |
电¬yºÏ¤Æªk |
|
Cut¡Ðoff level |
ºI¤î电¥ |
|
Dead zone |
ª¼区 |
|
Decay curve |
°I变¦±线 |
|
Decibel(dB) |
¤À贝 |
|
Defect |
¯Ê³´ |
|
Defect resolution |
¯Ê³´¤À¿ë¤O |
|
Defect detection sensitivity |
¯Ê³´检¥X灵±Ó«× |
|
Defect resolution |
¯Ê³´¤À¿ë¤O |
|
Definition |
²M´·«× |
|
Definition¡A image definition |
²M´·«×¡A图¹³²M´·«× |
|
Demagnetization |
°hºÏ |
|
Demagnetization factor |
°hºÏ¦]¤l |
|
Demagnetizer |
°hºÏ装¸m |
|
Densitometer |
¶Â«×计 |
|
Density |
¶Â«×¡]©³¤ù¡^ |
|
Density comparison strip |
¶Â«×¤ñ较¤ù |
|
Detecting medium |
检验¤¶质 |
|
Detergent remover |
¬~净²G |
|
Developer |
显¹³剂 |
|
Developer station |
显¹³¤u¦ì |
|
Developer¡A agueons |
¤ô©Ê显¶H剂 |
|
Developer¡A dry |
¤z显¶H剂 |
|
Developer¡A liquid film |
²G½¤显¶H剂 |
|
Developer¡A nonaqueous ¡]sus- pendible¡^ |
«D¤ô¡]¥i悬¯B¡^显¶H剂 |
|
Developing time |
显¹³时间 |
|
Development |
显¼v |
|
Diffraction mottle |
l®g´³ |
|
Diffuse indications |
ªQ´²«ü¥Ü |
|
Diffusion |
扩´² |
|
Digital image acquisition system |
数¦r图¹³识别¨t统 |
|
Dilatational wave |
¿±胀ªi |
|
Dip and drain station |
®û渍©M¬yºw¤u¦ì |
|
Direct contact magnetization |
ª½±µ±µàDºÏ¤Æ |
|
Direct exposure imaging |
ª½±µÃn¥ú¦¨¹³ |
|
Direct contact method |
ª½±µ±µàDªk |
|
Directivity |
«ü¦V©Ê |
|
Discontinuity |
¤£连续©Ê |
|
Distance- gain- size-German AVG |
¶ZÖÃ-
¼W¯q- ¤Ø¤o¡]DGS¼w¤å为AVG¡^ |
|
Distance marker; time marker |
¶ZÖèè«× |
|
Dose equivalent |
剂¶q当¶q |
|
Dose rate meter |
剂¶q²v计 |
|
Dosemeter |
剂¶q计 |
|
Double crystal probe |
双´¹¤ù±´头 |
|
Double probe technique |
双±´头ªk |
|
Double transceiver technique |
双发双¦¬ªk |
|
Double traverse technique |
¤G¦¸ªiªk |
|
Dragout |
带¥X |
|
Drain time |
ºw¸¨时间 |
|
Drain time |
¬yºw时间 |
|
Drift |
º}²¾ |
|
Dry method |
¤zªk |
|
Dry powder |
¤z¯» |
|
Dry technique |
¤z¯»§Þ术 |
|
Dry developer |
¤z显¹³剂 |
|
Dry developing cabinet |
¤z显¹³Ï@ |
|
Dry method |
¤z¯»ªk |
|
Drying oven |
¤zÀê½c |
|
Drying station |
¤zÀê¤u¦ì |
|
Drying time |
¤zÀê时间 |
|
D-scope; D-scan |
D«¬显¥Ü |
|
Dual search unit |
双±´头 |
|
Dual-focus tube |
双µJ点ºÞ |
|
Duplex-wire image quality indicator |
双线¹³质«ü¥Ü¾¹ |
|
Duration |
«ù续时间 |
|
Dwell time |
°±¯d时间 |
|
Dye penetrant |
着¦â渗³z剂 |
|
Dynamic leak test |
动态ªnº|检测 |
|
Dynamic leakage measurement |
动态ªnº|测¶q |
|
Dynamic range |
动态S围 |
|
Dynamic radiography |
动态®g线³z·Ó术 |
|
Echo |
¦^ªi |
|
Echo frequency |
¦^ªi频²v |
|
Echo height |
¦^ªi°ª«× |
|
Echo indication |
¦^ªi«ü¥Ü |
|
Echo transmittance of sound pressure |
©¹Î`³z过²v |
|
Echo width |
¦^ªi宽«× |
|
Eddy current |
涡¬y |
|
Eddy current flaw detector |
涡¬y±´伤仪 |
|
Eddy current testiog |
涡¬y检测 |
|
Edge |
ºÝ± |
|
Edge effect |
边缘®Ä应 |
|
Edge echo |
Ù±边¦^ªi |
|
Edge effect |
边缘®Ä应 |
|
Effective depth penetration ¡]EDP¡^ |
¦³®Ä¬ï³z²`«× |
|
Effective focus size |
¦³®ÄµJ点¤Ø¤o |
|
Effective magnetic permeability |
¦³®ÄºÏ导²v |
|
Effective permeability |
¦³®ÄºÏ导²v |
|
Effective reflection surface of flaw |
¯Ê³´¦³®Ä¤Ï®g± |
|
Effective resistance |
¦³®Ä电ªý |
|
Elastic medium |
弹©Ê¤¶质 |
|
Electric displacement |
电¦ì²¾ |
|
Electrical center |
电¤¤¤ß |
|
Electrode |
电Ìå |
|
Electromagnet |
电ºÏ铁 |
|
Electro-magnetic acoustic transducer |
电ºÏ声换¯à¾¹ |
|
Electromagnetic induction |
电ºÏ·P应 |
|
Electromagnetic radiation |
电ºÏ辐®g |
|
Electromagnetic testing |
电ºÏ检测 |
|
Electro-mechanical coupling factor |
Éó电½¢¦X¨t数 |
|
Electron radiography |
电¤l辐®g·Ó¬Û术 |
|
Electron volt |
电¤l¥ñ«î |
|
Electronic noise |
电¤l¾¸声 |
|
Electrostatic spraying |
静电喷Ò\ |
|
Emulsification |
¨Å¤Æ |
|
Emulsification time |
¨Å¤Æ时间 |
|
Emulsifier |
¨Å¤Æ剂 |
|
Encircling coils |
环绕¦¡线°é |
|
End effect |
ºÝ³¡®Ä应 |
|
Energizing cycle |
¿E励©P´Á |
|
Equalizing filter |
§¡¿Å滤ªi¾¹ |
|
Equivalent |
当¶q |
|
Equivalent I¡DQ. I. Sensitivity |
¶H质«ü¥Ü¾¹当¶q灵±Ó«× |
|
Equivalent nitrogen pressure |
µ¥®Ä´á压 |
|
Equivalent penetrameter sensifivty |
³z«×计当¶q灵±Ó«× |
|
Equivalent method |
当¶qªk |
|
Erasabl optical medium |
¥i±´¥ú学¤¶质 |
|
Etching |
®û蚀 |
|
Evaluation |
评©w |
|
Evaluation threshold |
评ɲ阈È |
|
Event count |
¨Æ¥ó计数 |
|
Event count rate |
¨Æ¥ó计数²v |
|
Examination area |
检测S围 |
|
Examination region |
检验区°ì |
|
Exhaust pressure/discharge pressure |
±ÆÉa压¤O |
|
Exhaust tubulation |
±ÆÉaºÞ¹D |
|
Expanded time-base sweep |
时°ò线®i宽 |
|
Exposure |
Ãn¥ú |
|
Exposure table |
Ãn¥úªí®æ |
|
Exposure chart |
Ãn¥ú¦±线 |
|
Exposure fog |
Ãn¥ú¦Ç雾 |
|
Exposure¡Aradiographic exposure |
Ãn¥ú¡A®g线·Ó¬ÛÃn¥ú |
|
Extended source |
扩®i·½ |
|
Facility scattered neutrons |
条¥ó´²®g¤¤¤l |
|
False indication |
°²«ü¥Ü |
|
Family |
±Ú |
|
Far field |
远场 |
|
Feed-through coil |
¬ï过¦¡线°é |
|
Field¡A resultant magnetic |
Î`¦XºÏ场 |
|
Fill factor |
¶ñ¥R¨t数 |
|
Film speed |
胶¤ù³t«× |
|
Film badge |
胶¤ùÃ̳¹剂¶q计 |
|
Film base |
¤ù°ò |
|
Film contrast |
胶¤ù对¤ñ«× |
|
Film gamma |
胶¤ù£^È |
|
Film processing |
胶¤ù冲¬~¥[¤u |
|
Film speed |
胶¤ù·P¥ú«× |
|
Film unsharpness |
胶¤ù¤£²M´·«× |
|
Film viewing screen |
观¹î«Ì |
|
Filter |
滤ªi¾¹/滤¥úªO |
|
Final test |
Î`±´ |
|
Flat-bottomed hole |
¥©³¤Õ |
|
Flat-bottomed hole equivalent |
¥©³¤Õ当¶q |
|
Flaw |
伤 |
|
Flaw characterization |
伤¯S©Ê |
|
Flaw echo |
¯Ê³´¦^ªi |
|
Flexural wave |
弯¦±ªi |
|
Floating threshold |
¯B动阀È |
|
Fluorescence |
荧¥ú |
|
Fluorescent examination method |
荧¥ú检验ªk |
|
Fluorescent magnetic particle inspection |
荧¥úºÏ¯»检验 |
|
Fluorescent dry deposit penetrant |
¤z¨I积荧¥ú渗³z剂 |
|
Fluorescent light |
荧¥ú |
|
Fluorescent magnetic powder |
荧¥úºÏ¯» |
|
Fluorescent penetrant |
荧¥ú渗³z剂 |
|
Fluorescent screen |
荧¥ú«Ì |
|
Fluoroscopy |
荧¥ú检¬dªk |
|
Flux leakage field |
ºÏ³qªnº|场 |
|
Flux lines |
ºÏ³q线 |
|
Focal spot |
µJ点 |
|
Focal distance |
µJ¶Z |
|
Focus length |
µJ点长«× |
|
Focus size |
µJ点¤Ø¤o |
|
Focus width |
µJ点宽«× |
|
Focus(electron) |
电¤lµJ点 |
|
Focused beam |
»EµJ声§ô |
|
Focusing probe |
»EµJ±´头 |
|
Focus-to-film distance(f.f.d) |
µJ点-胶¤ù¶ZÖá]µJ¶Z¡^ |
|
Fog |
©³¤ù¦Ç雾 |
|
Fog density |
¦Ç雾±K«× |
|
Footcandle |
^¤Ø烛¥ú |
|
Freguency |
频²v |
|
Frequency constant |
频²v±`数 |
|
Fringe |
¤z¯A带 |
|
Front distance |
«eªu¶ZÖÃ |
|
Front distance of flaw |
¯Ê³´«eªu¶ZÖà |
|
Full- wave direct current¡]FWDC¡^ |
¥þªiª½¬y |
|
Fundamental frequency |
°ò频 |
|
Furring |
¤ò状迹²ª |
|
Gage pressure |
ªí压 |
|
Gain |
¼W¯q |
|
Gamma radiography |
£^®g线³z·Ó术 |
|
Gamma ray source |
£^®g线·½ |
|
Gamma ray source container |
£^®g线·½®e¾¹ |
|
Gamma rays |
£^®g线 |
|
Gamma-ray radiographic equipment |
£^®g线³z·Ó装¸m |
|
Gap scanning |
间»Ø扫¬d |
|
Gas |
ÉaÊ^ |
|
Gate |
闸门 |
|
Gating technique |
选³q§Þ术 |
|
Gauss |
°ª´µ |
|
Geiger-Muller counter |
盖².弥°Ç计数¾¹ |
|
Geometric unsharpness |
¤L¦ó¤£²M´·«× |
|
Gray(Gy) |
¤à·ç |
|
Grazing incidence |
±°¤J®g |
|
Grazing angle |
±°®g¨¤ |
|
Group velocity |
¸s³t«× |
|
Half life |
¥b°I´Á |
|
Half- wave current ¡]HW¡^ |
¥bªi电¬y |
|
Half-value layer(HVL) |
¥bÈ层 |
|
Half-value method |
¥bªi°ª«×ªk |
|
Halogen |
卤¯À |
|
Halogen leak detector |
卤¯À检º|仪 |
|
Hard X-rays |
µwX®g线 |
|
Hard-faced probe |
µw½¤±´头 |
|
Harmonic analysis |
谐ªi¤ÀªR |
|
Harmonic distortion |
谐ªi·î变 |
|
Harmonics |
谐频 |
|
Head wave |
头ªi |
|
Helium bombing |
®ó轰击ªk |
|
Helium drift |
®óº}²¾ |
|
Helium leak detector |
®ó检º|仪 |
|
Hermetically tight seal |
Éa±K±K«Ê |
|
High vacuum |
°ª¯uªÅ |
|
High energy X-rays |
°ª¯àX®g线 |
|
Holography (optical) |
¥ú¥þ®§·Ó¬Û |
|
Holography¡A acoustic |
声¥þ®§ |
|
Hydrophilic emulsifier |
亲¤ô©Ê¨Å¤Æ剂 |
|
Hydrophilic remover |
亲¤ô©Ê¬~净剂 |
|
Hydrostatic text |
¬yÊ^静¤O检测 |
|
Hysteresis |
ºÏ滞 |
|
Hysteresis |
ºÏ滞 |
|
IACS |
IACS |
|
ID coil |
ID线°é |
|
Image definition |
图¹³²M´·«× |
|
Image contrast |
图¹³对¤ñ«× |
|
Image enhancement |
图¹³¼W强 |
|
Image magnification |
图¹³©ñ¤j |
|
Image quality |
图¹³质¶q |
|
Image quality indicator sensitivity |
¹³质«ü¥Ü¾¹灵±Ó«× |
|
Image quality indicator(IQI)/image quality indication |
¹³质«ü¥Ü¾¹ |
|
Imaging line scanner |
图¹³线扫´y¾¹ |
|
Immersion probe |
²G®û±´头 |
|
Immersion rinse |
®û没²M¬~ |
|
Immersion testing |
²G®ûªk |
|
Immersion time |
®û没时间 |
|
Impedance |
ªý§Ü |
|
Impedance plane diagram |
ªý§Ü¥±图 |
|
Imperfection |
¤£§¹¾ã©Ê |
|
Impulse eddy current testing |
脉冲涡¬y检测 |
|
Incremental permeability |
¼W¶qºÏ导²v |
|
Indicated defect area |
¯Ê³´«ü¥Ü±积 |
|
Indicated defect length |
¯Ê³´«ü¥Ü长«× |
|
Indication |
«ü¥Ü |
|
Indirect exposure |
间±µÃn¥ú |
|
Indirect magnetization |
间±µºÏ¤Æ |
|
Indirect magnetization method |
间±µºÏ¤Æªk |
|
Indirect scan |
间±µ扫¬d |
|
Induced field |
·P应ºÏ场 |
|
Induced current method |
·P应电¬yªk |
|
Infrared imaging system |
红¥~¦¨¶H¨t统 |
|
Infrared sensing device |
红¥~扫´y¾¹ |
|
Inherent fluorescence |
©T¦³荧¥ú |
|
Inherent filtration |
©T¦³滤ªi |
|
Initial permeability |
°_©lºÏ导²v |
|
Initial pulse |
©l脉冲 |
|
Initial pulse width |
©lªi宽«× |
|
Inserted coil |
´¡¤J¦¡线°é |
|
Inside coil |
内³¡线°é |
|
Inside- out testing |
¥~ªn检测 |
|
Inspection |
检¬d |
|
Inspection medium |
检¬d¤¶质 |
|
Inspection frequency/ test frequency |
检测频²v |
|
Intensifying factor |
¼W·P¨t数 |
|
Intensifying screen |
¼W·P«Ì |
|
Interal,arrival time ¡]£Gtij)/arrival time interval¡]£Gtij¡^ |
¨ì达时间®t(£Gtij) |
|
Interface boundary |
¬É± |
|
Interface echo |
¬É±¦^ªi |
|
Interface trigger |
¬É±àD发 |
|
Interference |
¤z¯A |
|
Interpretation |
¸Ñ释 |
|
Ion pump |
Öäl¬¦ |
|
Ion source |
Öäl·½ |
|
Ionization chamber |
电ÖÃ«Ç |
|
Ionization potential |
电ÖÃ电¦ì |
|
Ionization vacuum gage |
电ÖïuªÅ计 |
|
Ionography |
电Öîg线³z·Ó术 |
|
Irradiance¡A E |
辐®g³q¶q±K«×¡A
E |
|
Isolation |
¹jÖÃ检测 |
|
Isotope |
¦P¦ì¯À |
|
K
value |
KÈ |
|
Kaiser effect |
凯¶ë(Kaiser)®Ä应 |
|
Kilo volt |
kv ¤d¥ñ¯S |
|
Kiloelectron volt |
keV¤d电¤l¥ñ¯S |
|
Krypton 85 |
Õß85 |
|
L¡þD ratio |
L/D¤ñ |
|
Lamb wave |
兰©iªi |
|
Latent image |
潜¶H |
|
Lateral scan |
¥ª¥k扫¬d |
|
Lateral scan with oblique angle |
±×¥¦æ扫¬d |
|
Latitude (of an emulsion) |
胶¤ù宽®e«× |
|
Lead screen |
铅«Ì |
|
Leak |
ªnº|¤Õ |
|
Leak artifact |
ªnº|¾¹ |
|
Leak detector |
检º|仪 |
|
Leak testtion |
ªnº|检测 |
|
Leakage field |
ªnº|ºÏ场 |
|
Leakage rate |
ªnº|²v |
|
Leechs |
ºÏ§l盘 |
|
Lift-off effect |
´£ÖîÄ应 |
|
Light intensity |
¥ú强«× |
|
Limiting resolution |
Ìå¤À¿ë²v |
|
Line scanner |
线扫´y¾¹ |
|
Line focus |
线µJ点 |
|
Line pair pattern |
线对检测图 |
|
Line pairs per millimetre |
¨C²@¦Ì线对数 |
|
Linear (electron) accelerator(LINAC) |
电¤lª½线¥[³t¾¹ |
|
Linear attenuation coefficient |
线°I减¨t数 |
|
Linear scan |
线扫¬d |
|
Linearity ¡]time or distance¡^ |
线©Ê¡]时间©Î¶ZÖá^ |
|
Linearity¡A anplitude |
´T«×线©Ê |
|
Lines of force |
ºÏ¤O线 |
|
Lipophilic emulsifier |
亲ªo©Ê¨Å¤Æ剂 |
|
Lipophilic remover |
亲ªo©Ê¬~净剂 |
|
Liquid penetrant examination |
²GÊ^渗³z检验 |
|
Liquid film developer |
²G½¤显¹³剂 |
|
Local magnetization |
§½³¡ºÏ¤Æ |
|
Local magnetization method |
§½³¡ºÏ¤Æªk |
|
Local scan |
§½³¡扫¬d |
|
Localizing cone |
©w°ì³â¥zµ© |
|
Location |
©w¦ì |
|
Location accuracy |
©w¦ìºë«× |
|
Location computed |
©w¦ì¡A计ºâ |
|
Location marker |
©w¦ì标记 |
|
Location upon delta-T |
时®t©w¦ì |
|
Location¡A clusfer |
©w¦ì¡A¸s¶° |
|
Location¡Acontinuous AE signal |
©w¦ì¡A连续AE«H号 |
|
Longitudinal field |
纵¦VºÏ场 |
|
Longitudinal magnetization method |
纵¦VºÏ¤Æªk |
|
Longitudinal resolution |
纵¦V¤À¿ë²v |
|
Longitudinal wave |
纵ªi |
|
Longitudinal wave probe |
纵ªi±´头 |
|
Longitudinal wave technique |
纵ªiªk |
|
Loss of back reflection |
I±¤Ï®g损¥¢ |
|
Loss of back reflection |
©³±¤Ï®g损¥¢ |
|
Love wave |
乐¨jªi |
|
Low energy gamma radiation |
§C¯à£^辐®g |
|
Low¡Ðenerugy photon radiation |
§C¯à¥ú¤l辐®g |
|
Luminance |
«G«× |
|
Luminosity |
¬y©ú |
|
Lusec |
¬y¦è§J |
|
Maga or million electron volts |
MeV¥ü电¤l¥ñ¯S |
|
Magnetic history |
ºÏ¤Æ¥v |
|
Magnetic hysteresis |
ºÏ©Ê滞¦Z |
|
Magnetic particle field indication |
ºÏ¯»ºÏ场«ü¥Ü¾¹ |
|
Magnetic particle inspection flaw indications |
ºÏ¯»检验ªº伤显¥Ü |
|
Magnetic circuit |
ºÏ¸ô |
|
Magnetic domain |
ºÏ畴 |
|
Magnetic field distribution |
ºÏ场¤À¥¬ |
|
Magnetic field indicator |
ºÏ场«ü¥Ü¾¹ |
|
Magnetic field meter |
ºÏ场计 |
|
Magnetic field strength |
ºÏ场强«×(H) |
|
Magnetic field/field¡Amagnetic |
ºÏ场 |
|
Magnetic flux |
ºÏ³q |
|
Magnetic flux density |
ºÏ³q±K«× |
|
Magnetic force |
ºÏ¤Æ¤O |
|
Magnetic leakage field |
º|ºÏ场 |
|
Magnetic leakage flux |
º|ºÏ³q |
|
Magnetic moment |
ºÏ¯x |
|
Magnetic particle |
ºÏ¯» |
|
Magnetic particle indication |
ºÏ²ª |
|
Magnetic particle testing/magnetic particle examination |
ºÏ¯»检测 |
|
Magnetic permeability |
ºÏ导²v |
|
Magnetic permeability |
ºÏ导²v |
|
Magnetic pole |
ºÏÌå |
|
Magnetic saturataion |
ºÏ饱©M |
|
Magnetic saturation |
ºÏ饱©M |
|
Magnetic slorage meclium |
ºÏ储¤¶质 |
|
Magnetic writing |
ºÏ写 |
|
Magnetizing |
ºÏ¤Æ |
|
Magnetizing current |
ºÏ¤Æ电¬y |
|
Magnetizing coil |
ºÏ¤Æ线°é |
|
Magnetostrictive effect |
ºÏP¦ù缩®Ä应 |
|
Magnetostrictive transducer |
ºÏP¦ù缩换¯à¾¹ |
|
Main beam |
¥D声§ô |
|
Manual testing |
¤â动检测 |
|
Markers |
时标 |
|
MA-scope; MA-scan |
MA«¬显¥Ü |
|
Masking |
¾B½ª |
|
Mass attcnuation coefficient |
质¶q§l¦¬¨t数 |
|
Mass number |
质¶q数 |
|
Mass spectrometer ¡]M.S.¡^ |
质谱仪 |
|
Mass spectrometer leak detector |
质谱检º|仪 |
|
Mass spectrum |
质谱 |
|
Master/slave discrimination |
¥D从鉴别 |
|
MDTD |
³Ì¤p¥i测温«×®t |
|
Mean free path |
¥§¡¦Û¥Ñµ{ |
|
Medium vacuum |
¤¤¯uªÅ |
|
Mega or million volt |
MV¥ü¥ñ¯S |
|
Micro focus X - ray tube |
·LµJ点X
¥úºÞ |
|
Microfocus radiography |
·LµJ点®g线³z·Ó术 |
|
Micrometre |
·L¦Ì |
|
Micron of mercury |
·L¦Ì¨E¬W |
|
Microtron |
电¤l¦^±Û¥[³t¾¹ |
|
Milliampere |
²@¦w¡]mA¡^ |
|
Millimetre of mercury |
²@¦Ì¨E¬W |
|
Minifocus x- ray tube |
¤pµJ点调®g线ºÞ |
|
Minimum detectable leakage rate |
³Ì¤p¥i±´ªnº|²v |
|
Minimum resolvable temperature difference ¡]MRTD¡^ |
³Ì¤p¥i¤À¿ë温«×®t¡]MRDT¡^ |
|
Mode |
ªi«¬ |
|
Mode conversion |
ªi«¬转换 |
|
Mode transformation |
ªi«¬转换 |
|
Moderator |
ºC¤Æ¾¹ |
|
Modulation transfer function ¡]MTF¡^ |
调¨î转换¥\¯à¡]MTF¡^ |
|
Modulation analysis |
调¨î¤ÀªR |
|
Molecular flow |
¤À¤l¬y |
|
Molecular leak |
¤À¤lªnº| |
|
Monitor |
监±±¾¹ |
|
Monochromatic |
单¦âªi |
|
Movement unsharpness |
²¾动¤£²M´·«× |
|
Moving beam radiography |
¥i动®g§ô®g线³z·Ó术 |
|
Multiaspect magnetization method |
¦h¦VºÏ¤Æªk |
|
Multidirectional magnetization |
¦h¦VºÏ¤Æ |
|
Multifrequency eddy current testiog |
¦h频涡¬y检测 |
|
Multiple back reflections |
¦h¦¸I±¤Ï®g |
|
Multiple reflections |
¦h¦¸¤Ï®g |
|
Multiple back reflections |
¦h¦¸©³±¤Ï®g |
|
Multiple echo method |
¦h¦¸¤Ï®gªk |
|
Multiple probe technique |
¦h±´头ªk |
|
Multiple triangular array |
¦h¤T¨¤§Î阵¦C |
|
Narrow beam condition |
¯¶®g§ô |
|
NC |
NC |
|
Near field |
ªñ场 |
|
Near field length |
ªñ场长«× |
|
Near surface defect |
ªñªí±¯Ê³´ |
|
Net density |
净¶Â«× |
|
Net density |
净(¥ú学)±K«× |
|
Neutron |
¤¤¤l |
|
Neutron radiograhy |
¤¤¤l®g线³z·Ó |
|
Neutron radiography |
¤¤¤l®g线³z·Ó术 |
|
Newton ¡]N¡^ |
¤û顿 |
|
Nier mass spectrometer |
¥§尔质谱仪 |
|
Noise |
¾¸声 |
|
Noise |
¾¸声 |
|
Noise equivalent temperature difference ¡]NETD¡^ |
¾¸声当¶q温«×®t¡]NETD¡^ |
|
Nominal angle |
标称¨¤«× |
|
Nominal frequency |
标称频²v |
|
Non-aqueous liquid developer |
«D¤ô©Ê²GÊ^显¹³剂 |
|
Noncondensable gas |
«D§N¾®ÉaÊ^ |
|
Nondcstructivc Examination¡]NDE¡^ |
无损试验 |
|
Nondestructive Evaluation¡]NDE¡^ |
无损评ɲ |
|
Nondestructive Inspection¡]NDI¡^ |
无损检验 |
|
Nondestructive Testing¡]NDT¡^ |
无损检测 |
|
Nonerasble optical data |
¥i©T©w¥ú学数Õu |
|
Nonferromugnetic material |
«D铁ºÏ©Ê§÷®Æ |
|
Nonrelevant indication |
«D¬Û关«ü¥Ü |
|
Non-screen-type film |
«D¼W·P«¬胶¤ù |
|
Normal incidence |
««ª½¤J®g¡]¥ç见ª½®g声§ô¡^ |
|
Normal permeability |
标ãºÏ导²v |
|
Normal beam method; straight beam method |
««ª½ªk |
|
Normal probe |
ª½±´头 |
|
Normalized reactance |
归¤@¤Æ电§Ü |
|
Normalized resistance |
归¤@¤Æ电ªý |
|
Nuclear activity |
®Ö¬¡©Ê |
|
Nuclide |
®Ö¯À |
|
Object plane resolution |
ª«Ê^¥±¤À¿ë²v |
|
Object scattered neutrons |
ª«Ê^´²®g¤¤¤l |
|
Object beam |
ª«Ê^¥ú§ô |
|
Object beam angle |
ª«Ê^¥ú§ô¨¤ |
|
Object-film distance |
³Q检Ê^-胶¤ù¶ZÖÃ |
|
Object¤@film distance |
ª«Ê^-
胶¤ù¶ZÖÃ |
|
Over development |
显¼v过«× |
|
Over emulsfication |
过¨Å¤Æ |
|
Overall magnetization |
¾ãÊ^ºÏ¤Æ |
|
Overload recovery time |
过载«ìÎ`时间 |
|
Overwashing |
过¬~ |
|
Oxidation fog |
®ñ¤Æ¦Ç雾 |
|
P |
P |
|
Pair production |
°¸¥Í¦¨ |
|
Pair production |
电¤l对产¥Í |
|
Pair production |
电¤l°¸ªº产¥Í |
|
Palladium barrier leak detector |
钯«Ì检º|仪 |
|
Panoramic exposure |
¥þ´ºÃn¥ú |
|
Parallel scan |
¥¦æ扫¬d |
|
Paramagnetic material |
顺ºÏ©Ê§÷®Æ |
|
Parasitic echo |
¤zÊð¦^ªi |
|
Partial pressure |
¤À压 |
|
Particle content |
ºÏ悬²G浓«× |
|
Particle velocity |
质点(®¶动)³t«× |
|
Pascal ¡]Pa¡^ |
©¬´µ¥d¡]©¬¡^ |
|
Pascal cubic metres per second |
©¬¥ß¤è¦Ì¨C¬í¡]Pa¡Pm3/s
¡^ |
|
Path length |
¥úµ{长 |
|
Path length difference |
¥úµ{长«×®t |
|
Pattern |
±´伤图§Î |
|
Peak current |
®pÈ电¬y |
|
Penetrameter |
³z«×计 |
|
Penetrameter sensitivity |
³z«×计灵±Ó«× |
|
Penetrant |
渗³z剂 |
|
Penetrant comparator |
渗³z对¤ñ试块 |
|
Penetrant flaw detection |
渗³z±´伤 |
|
Penetrant removal |
渗³z剂¥h°£ |
|
Penetrant station |
渗³z¤u¦ì |
|
Penetrant¡A water- washable |
¤ô¬~«¬渗³z剂 |
|
Penetration |
¬ï³z²`«× |
|
Penetration time |
渗³z时间 |
|
Permanent magnet |
¥Ã¤[ºÏ铁 |
|
Permeability coefficient |
³zÉa¨t数 |
|
Permeability¡Aa-c |
¥æ¬yºÏ导²v |
|
Permeability¡Ad¡Ðc |
ª½¬yºÏ导²v |
|
Phantom echo |
¤Û¶H¦^ªi |
|
Phase analysis |
¬Û¦ì¤ÀªR |
|
Phase angle |
¬Û¦ì¨¤ |
|
Phase controlled circuit breaker |
断电¬Û¦ì±±¨î¾¹ |
|
Phase detection |
¬Û¦ì检测 |
|
Phase hologram |
¬Û¦ì¥þ®§ |
|
Phase sensitive detector |
¬Û±Ó检ªi¾¹ |
|
Phase shift |
¬Û¦ì²¾ |
|
Phase velocity |
¬Û³t«× |
|
Phase-sensitive system |
¬Û±Ó¨t统 |
|
Phillips ionization gage |
µá§Q®ú电ÖÃ计 |
|
Phosphor |
荧¥úª«质 |
|
Photo fluorography |
荧¥ú·Ó¬Û术 |
|
Photoelectric absorption |
¥ú电§l¦¬ |
|
Photographic emulsion |
·Ó¬Û¨Å剂 |
|
Photographic fog |
·Ó¬Û¦Ç雾 |
|
Photostimulable luminescence |
¥ú±Ó发¥ú |
|
Piezoelectric effect |
压电®Ä应 |
|
Piezoelectric material |
压电§÷®Æ |
|
Piezoelectric stiffness constant |
压电劲«×±`数 |
|
Piezoelectric stress constant |
压电应¤O±`数 |
|
Piezoelectric transducer |
压电换¯à¾¹ |
|
Piezoelectric voltage constant |
压电电压±`数 |
|
Pirani gage |
¥Ö©Ô¥§计 |
|
Pirani gage |
¥Ö©Ô¥§计 |
|
Pitch and catch technique |
¤@发¤@¦¬ªk |
|
Pixel |
¶H¯À |
|
Pixel size |
¶H¯À¤Ø¤o |
|
Pixel¡A disply size |
¶H¯À显¥Ü¤Ø¤o |
|
Planar array |
¥±阵(¦C) |
|
Plane wave |
¥±ªi |
|
Plate wave |
ªOªi |
|
Plate wave technique |
ªOªiªk |
|
Point source |
点·½ |
|
Post emulsification |
¦Z¨Å¤Æ |
|
Post emulsifiable penetrant |
¦Z¨Å¤Æ渗³z剂 |
|
Post-cleaning |
¦Z²M°£ |
|
Post-cleaning |
¦Z²M¬~ |
|
Powder |
¯»¥¼ |
|
Powder blower |
喷¯»¾¹ |
|
Powder blower |
ºÏ¯»喷枪 |
|
Pre-cleaning |
预²M²z |
|
Pressure difference |
压¤O®t |
|
Pressure dye test |
压¤O着¦â检测 |
|
Pressure probe |
压¤O±´头 |
|
Pressure testing |
压¤O检测 |
|
Pressure- evacuation test |
压¤O©âªÅ检测 |
|
Pressure mark |
压²ª |
|
Pressure,design |
设计压¤O |
|
Pre-test |
ªì±´ |
|
Primary coil |
¤@¦¸线°é |
|
Primary radiation |
ªì级辐®g |
|
Probe gas |
±´头ÉaÊ^ |
|
Probe test |
±´头检测 |
|
Probe backing |
±´头I衬 |
|
Probe coil |
点¦¡线°é |
|
Probe coil |
±´头¦¡线°é |
|
Probe coil clearance |
±´头线°é间»Ø |
|
Probe index |
±´头¤J®g点 |
|
Probe to weld distance |
±´头-²k缝¶ZÖÃ |
|
Probe/ search unit |
±´头 |
|
Process control radiograph |
¤u艺过µ{±±¨îªº®g线·Ó¬Û |
|
Processing capacity |
处²z¯à¤O |
|
Processing speed |
处²z³t«× |
|
Prods |
àD头 |
|
Projective radiography |
§ë¼v®g线³z·Ó术 |
|
Proportioning probe |
¤ñ¨Ò±´头 |
|
Protective material |
¨¾护§÷®Æ |
|
Proton radiography |
质¤l®g线³z·Ó |
|
Pulse |
脉冲ªi |
|
Pulse |
脉冲 |
|
Pulse echo method |
脉冲¦^ªiªk |
|
Pulse repetition rate |
脉冲«Î`²v |
|
Pulse amplitude |
脉冲´T«× |
|
Pulse echo method |
脉冲¤Ï®gªk |
|
Pulse energy |
脉冲¯à¶q |
|
Pulse envelope |
脉冲¥]络 |
|
Pulse length |
脉冲长«× |
|
Pulse repetition frequency |
脉冲«Î`频²v |
|
Pulse tuning |
脉冲调谐 |
|
Pump- out tubulation |
©âÉaºÞ¹D |
|
Pump-down time |
©âÉa时间 |
|
Q
factor |
QÈ |
|
Quadruple traverse technique |
¥|¦¸ªiªk |
|
Quality (of a beam of radiation) |
®g线§ôªº质 |
|
Quality factor |
«~质¦]数 |
|
Quenching |
ªý¶ë |
|
Quenching of fluorescence |
荧¥úªºÖ`灭 |
|
Quick break |
§Ö³t断间 |
|
Rad(rad) |
©Ô¼w |
|
Radiance¡A L |
±辐®g²v¡AL |
|
Radiant existence¡A M |
´T®g·Ó«×M |
|
Radiant flux¡F radiant power¡A£re |
辐®g³q¶q¡B辐®g¥\²v¡B£re |
|
Radiation |
辐®g |
|
Radiation does |
辐®g剂¶q |
|
Radio frequency ¡]r- f¡^ display |
®g频显¥Ü |
|
Radio- frequency mass spectrometer |
®g频质谱仪 |
|
Radio frequency(r-f) display |
®g频显¥Ü |
|
Radiograph |
®g线©³¤ù |
|
Radiographic contrast |
®g线·Ó¤ù对¤ñ«× |
|
Radiographic equivalence factor |
®g线·Ó¬Ûµ¥®Ä¨t数 |
|
Radiographic exposure |
®g线·Ó¬ÛÃn¥ú¶q |
|
Radiographic inspection |
®g线检测 |
|
Radiographic inspection |
®g线·Ó¬Û检验 |
|
Radiographic quality |
®g线·Ó¬Û质¶q |
|
Radiographic sensitivity |
®g线·Ó¬Û灵±Ó«× |
|
Radiographic contrast |
®g线©³¤ù对¤ñ«× |
|
Radiographic equivalence factor |
®g线³z·Óµ¥®Ä¦]¤l |
|
Radiographic inspection |
®g线³z·Ó检¬d |
|
Radiographic quality |
®g线³z·Ó质¶q |
|
Radiographic sensitivity |
®g线³z·Ó灵±Ó«× |
|
Radiography |
®g线·Ó¬Û术 |
|
Radiological examination |
®g线检验 |
|
Radiology |
®g线学 |
|
Radiometer |
辐®g计 |
|
Radiometry |
辐®g测¶q术 |
|
Radioscopy |
®g线检¬dªk |
|
Range |
¶qµ{ |
|
Rayleigh wave |
·ç§Qªi |
|
Rayleigh scattering |
·ç§Q´²®g |
|
Real image |
实时图¹³ |
|
Real-time radioscopy |
实时®g线检¬dªk |
|
Rearm delay time |
«·sã备©µ时时间 |
|
Rearm delay time |
«·s进¤J¤u§@状态©µ迟时间 |
|
Reciprocity failure |
Ë©ö«ß¥¢®Ä |
|
Reciprocity law |
Ë©ö«ß |
|
Recording medium |
记录¤¶质 |
|
Recovery time |
«ìÎ`时间 |
|
Rectified alternating current |
脉动ª½¬y电 |
|
Reference block |
参¦Ò试块 |
|
Reference beam |
参¦Ò¥ú§ô |
|
Reference block |
对¤ñ试块 |
|
Reference block method |
对¤ñ试块ªk |
|
Reference coil |
参¦Ò线°é |
|
Reference line method |
°òã线ªk |
|
Reference standard |
参¦Ò标ã |
|
Reflection |
¤Ï®g |
|
Reflection coefficient |
¤Ï®g¨t数 |
|
Reflection density |
¤Ï®g±K«× |
|
Reflector |
¤Ï®gÊ^ |
|
Refraction |
§é®g |
|
Refractive index |
§é®g²v |
|
Refrence beam angle |
参¦Ò¥ú§ô¨¤ |
|
Reicnlbation |
ÊI纹 |
|
Reject; suppression |
§í¨î |
|
Rejection level |
©Ú¦¬¤ô¥ |
|
Relative permeability |
¬Û对ºÏ导²v |
|
Relevant indication |
¬Û关«ü¥Ü |
|
Reluctance |
ºÏªý |
|
Rem(rem) |
¹p©i |
|
Remote controlled testing |
Éó±ñ¤Æ检测 |
|
Replenisers |
补¥R剂 |
|
Representative quality indicator |
¥Nªí©Ê质¶q«ü¥Ü¾¹ |
|
Residual magnetic field/field¡A residual magnetic |
³ÑºÏ场 |
|
Residual technique |
³ÑºÏ§Þ术 |
|
Residual magnetic method |
³ÑºÏªk |
|
Residual magnetism |
³ÑºÏ |
|
Resistance ¡]to flow¡^ |
Éaªý |
|
Resolution |
¤À¿ë¤O |
|
Resonance method |
¦@®¶ªk |
|
Response factor |
响应¨t数 |
|
Response time |
响应时间 |
|
Resultant field |
Î`¦XºÏ场 |
|
Resultant magnetic field |
¦X¦¨ºÏ场 |
|
Resultant magnetization method |
组¦XºÏ¤Æªk |
|
Retentivity |
顽ºÏ©Ê |
|
Reversal |
¤Ï转现¶H |
|
Ring-down count |
®¶铃计数 |
|
Ring-down count rate |
®¶铃计数²v |
|
Rinse |
²M¬~ |
|
Rise time |
¤W¤É时间 |
|
Rise-time discrimination |
¤W¤É时间鉴别 |
|
Rod-anode tube |
´Î阳ÌåºÞ |
|
Roentgen(R) |
伦µ^ |
|
Roof angle |
«Î顶¨¤ |
|
Rotational magnetic field |
±Û转ºÏ场 |
|
Rotational magnetic field method |
±Û转ºÏ场ªk |
|
Rotational scan |
转动扫¬d |
|
Roughing |
§C¯uªÅ |
|
Roughing line |
§C¯uªÅºÞ¹D |
|
Roughing pump |
§C¯uªÅ¬¦ |
|
S |
S |
|
Safelight |
¦w¥þ灯 |
|
Sampling probe |
¨ú样±´头 |
|
Saturation |
饱©M |
|
Saturation¡Amagnetic |
ºÏ饱©M |
|
Saturation level |
饱©M电¥ |
|
Scan on grid lines |
®æ¤l线扫¬d |
|
Scan pitch |
扫¬d间¶Z |
|
Scanning |
扫¬d |
|
Scanning index |
扫¬d标记 |
|
Scanning directly on the weld |
²k缝¤W扫¬d |
|
Scanning path |
扫¬d轨迹 |
|
Scanning sensitivity |
扫¬d灵±Ó«× |
|
Scanning speed |
扫¬d³t«× |
|
Scanning zone |
扫¬d区°ì |
|
Scattared energy |
´²®g¯à¶q |
|
Scatter unsharpness |
´²®g¤£²M´·«× |
|
Scattered neutrons |
´²®g¤¤¤l |
|
Scattered radiation |
´²®g辐®g |
|
Scattering |
´²®g |
|
Schlieren system |
¬I§Q伦¨t统 |
|
Scintillation counter |
闪烁计数¾¹ |
|
Scintillator and scintillating crystals |
闪烁¾¹©M闪烁´¹Ê^ |
|
Screen |
«Ì |
|
Screen unsharpness |
荧¥ú¼W·P«Ì¤£²M´·«× |
|
Screen-type film |
荧¥ú¼W·P«¬胶¤ù |
|
SE probe |
SE±´头 |
|
Search-gas |
±´测ÉaÊ^ |
|
Second critical angle |
²Ä¤G临¬É¨¤ |
|
Secondary radiation |
¤G¦¸®g线 |
|
Secondary coil |
¤G¦¸线°é |
|
Secondary radiation |
¦¸级辐®g |
|
Selectivity |
选择©Ê |
|
Semi-conductor detector |
¥b导Ê^±´测¾¹ |
|
Sensitirity va1ue |
灵±Ó«×È |
|
Sensitivity |
灵±Ó«× |
|
Sensitivity of leak test |
ªnº|检测灵±Ó«× |
|
Sensitivity control |
灵±Ó«×±±¨î |
|
Shear wave |
¤Á变ªi |
|
Shear wave probe |
横ªi±´头 |
|
Shear wave technique |
横ªiªk |
|
Shim |
Á¡垫¤ù |
|
Shot |
冲击³q电 |
|
Side lobe |
°Æä |
|
Side wall |
侧± |
|
Sievert(Sv) |
§Æ(¨U¯S) |
|
Signal |
«H号 |
|
Signal gradient |
«H号±è«× |
|
Signal over load point |
«H号过载点 |
|
Signal overload level |
«H号过载电¥ |
|
Signal to noise ratio |
«H¾¸¤ñ |
|
Single crystal probe |
单´¹¤ù±´头 |
|
Single probe technique |
单±´头ªk |
|
Single traverse technique |
¤@¦¸ªiªk |
|
Sizing technique |
©w¶qªk |
|
Skin depth |
¶°肤²`«× |
|
Skin effect |
¶°肤®Ä应 |
|
Skip distance |
¸ó¶Z |
|
Skip point |
¸ó¶Z点 |
|
Sky shine(air scatter) |
ªÅ¤¤´²®g®Ä应 |
|
Sniffing probe |
¶å§l±´头 |
|
Soft X-rays |
软X®g线 |
|
Soft-faced probe |
软½¤±´头 |
|
Solarization |
负·P§@¥Î |
|
Solenoid |
Á³线ºÞ |
|
Soluble developer |
¥i·»显¹³剂 |
|
Solvent remover |
·»剂¥h°£剂 |
|
Solvent cleaners |
·»剂²M°£剂 |
|
Solvent developer |
·»剂显¹³剂 |
|
Solvent remover |
·»剂¬~净剂 |
|
Solvent-removal penetrant |
·»剂¥h°£«¬渗³z剂 |
|
Sorption |
§l着 |
|
Sound diffraction |
声绕®g |
|
Sound insulating layer |
¹j声层 |
|
Sound intensity |
声强 |
|
Sound intensity level |
声强级 |
|
Sound pressure |
声压 |
|
Sound scattering |
声´²®g |
|
Sound transparent layer |
³z声层 |
|
Sound velocity |
声³t |
|
Source |
·½ |
|
Source data label |
©ñ®g·½数Õu标签 |
|
Source location |
·½©w¦ì |
|
Source size |
·½¤Ø¤o |
|
Source-film distance |
®g线·½-胶¤ù¶ZÖÃ |
|
Spacial frequency |
ªÅ间频²v |
|
Spark coil leak detector |
电¤õªá线°é检º|仪 |
|
Specific activity |
©ñ®g©Ê¤ñ«× |
|
Specified sensitivity |
规©w灵±Ó«× |
|
Standard |
标ã |
|
Standard |
标ã试样 |
|
Standard leak rate |
标ãªnº|²v |
|
Standard leak |
标ãªnº|¤Õ |
|
Standard tast block |
标ã试块 |
|
Standardization instrument |
设备标ã¤Æ |
|
Standing wave; stationary wave |
驻ªi |
|
Step wedge |
阶±è·¤块 |
|
Step- wadge calibration film |
阶±è·¤块®Õ㩳¤ù |
|
Step- wadge comparison film |
阶±è·¤块¤ñ较©³¤ù |
|
Step wedge |
阶±è·¤块 |
|
Step-wedge calibration film |
阶±è-·¤块®Õã¤ù |
|
Step-wedge comparison film |
阶±è-·¤块¤ñ较¤ù |
|
Stereo-radiography |
¥ßÊ^®g线³z·Ó术 |
|
Subject contrast |
³Q检Ê^对¤ñ«× |
|
Subsurface discontinuity |
ªñªí±¤£连续©Ê |
|
Suppression |
§í¨î |
|
Surface echo |
ªí±¦^ªi |
|
Surface field |
ªí±ºÏ场 |
|
Surface noise |
ªí±¾¸声 |
|
Surface wave |
ªí±ªi |
|
Surface wave probe |
ªí±ªi±´头 |
|
Surface wave technique |
ªí±ªiªk |
|
Surge magnetization |
脉动ºÏ¤Æ |
|
Surplus sensitivity |
灵±Ó«×§E¶q |
|
Suspension |
ºÏ悬²G |
|
Sweep |
扫´y
|
|
Sweep range |
扫´yS围 |
|
Sweep speed |
扫´y³t«× |
|
Swept gain |
扫´y¼W¯q |
|
Swivel scan |
环绕扫¬d |
|
System exanlillatien threshold |
¨t统检验阈È |
|
System inclacel artifacts |
¨t统·P¥Íª« |
|
System noise |
¨t统¾¸声 |
|
Tackground¡A target |
¥Ø标¥»©³ |
|
Tandem scan |
¦ê¦C扫¬d |
|
Target |
¯Ò |
|
Target |
¹v |
|
Television fluoroscopy |
电视X®g线荧¥ú检¬d |
|
Temperature envelope |
温«×S围 |
|
Tenth-value-layer(TVL) |
¤Q¤À¤§¤@È层 |
|
Test coil |
检测线°é |
|
Test quality level |
检测质¶q¤ô¥ |
|
Test ring |
试环 |
|
Test block |
试块 |
|
Test frequency |
试验频²v |
|
Test piece |
试¤ù |
|
Test range |
±´测S围 |
|
Test surface |
±´测± |
|
Testing¡Aulrasonic |
¶W声检测 |
|
Thermal neutrons |
热¤¤¤l |
|
Thermocouple gage |
热电°¸计 |
|
Thermogram |
热谱图 |
|
Thermography¡A infrared |
红¥~热¦¨¶H |
|
Thermoluminescent dosemeter(TLD) |
热释¥ú剂¶q计 |
|
Thickness sensitivity |
«p«×灵±Ó«× |
|
Third critiical angle |
²Ä¤T临¬É¨¤ |
|
Thixotropic penetrant |
摇·»渗³z剂 |
|
Thormal resolution |
热¤À¿ë²v |
|
Threading bar |
¬ï´Î |
|
Three way sort |
¤T档¤À选 |
|
Threshold setting |
门设¸m |
|
Threshold fog |
阈ȦÇ雾 |
|
Threshold level |
阀È |
|
Threshotd tcnet |
门电¥ |
|
Throttling |
节¬y |
|
Through transmission technique |
¬ï³z§Þ术 |
|
Through penetration technique |
贯¬ï渗³zªk |
|
Through transmission technique; transmission technique |
¬ï³zªk |
|
Through-coil technique |
¬ï过¦¡线°é§Þ术 |
|
Throughput |
³qÉa¶q |
|
Tight |
±K«Ê |
|
Total reflection |
¥þ¤Ï®g |
|
Totel image unsharpness |
总ªº图¹³¤£²M´·«× |
|
Tracer probe leak location |
¥Ü踪±´头ªnº|©w¦ì |
|
Tracer gas |
¥Ü踪ÉaÊ^ |
|
Transducer |
换¯à¾¹/传·P¾¹ |
|
Transition flow |
过´ç¬y |
|
Translucent base media |
¥b³z©ú载Ê^¤¶质 |
|
Transmission |
³z®g |
|
Transmission densitomefer |
发®g±K«×计 |
|
Transmission coefficient |
³z®g¨t数 |
|
Transmission point |
³z®g点 |
|
Transmission technique |
³z®g§Þ术 |
|
Transmittance¡A£n |
³z®g²v£n |
|
Transmitted film density |
检测©³¤ù¶Â«× |
|
Transmitted pulse |
发®g脉冲 |
|
Transverse resolution |
横¦V¤À¿ë²v |
|
Transverse wave |
横ªi |
|
Traveling echo |
´å动¦^ªi |
|
Travering scan; depth scan |
«e¦Z扫¬d |
|
Triangular array |
¥¿¤T¨¤§Î阵¦C |
|
Trigger/alarm condition |
àD发/报ĵ状态 |
|
Trigger/alarm level |
àD发/报ĵ标ã |
|
Triple traverse technique |
¤T¦¸ªiªk |
|
True continuous technique |
ãÚÌ连续ªk§Þ术 |
|
Trueattenuation |
¯u实°I减 |
|
Tube current |
ºÞ电¬y |
|
Tube head |
ºÞ头 |
|
Tube shield |
ºÞ¸n |
|
Tube shutter |
ºÞ¤l¥ú闸 |
|
Tube window |
ºÞµ¡ |
|
Tube-shift radiography |
ºÞ¤l²¾¦ì®g线³z·Ó术 |
|
Two-way sort |
两档¤À选 |
|
Ultra- high vacuum |
¶W°ª¯uªÅ |
|
Ultrasonic leak detector |
¶W声ªi检º|仪 |
|
Ultrasonic noise level |
¶W声¾¸声电¥ |
|
Ultrasonic cleaning |
¶W声ªi²M¬~ |
|
Ultrasonic field |
¶W声场 |
|
Ultrasonic flaw detection |
¶W声±´伤 |
|
Ultrasonic flaw detector |
¶W声±´伤仪 |
|
Ultrasonic microscope |
¶W声显·L镜 |
|
Ultrasonic spectroscopy |
¶W声频谱 |
|
Ultrasonic testing system |
¶W声检测¨t统 |
|
Ultrasonic thickness gauge |
¶W声测«p仪 |
|
Ultraviolet radiation |
µµ¥~辐®g |
|
Under development |
显¼v¤£¨¬ |
|
Unsharpness |
¤£²M´· |
|
Useful density range |
¦³®Ä¥ú学±K«×S围 |
|
UV-A |
A类µµ¥~辐®g |
|
UV-A filter |
A类µµ¥~辐®g滤¤ù |
|
Vacuum |
¯uªÅ |
|
Vacuum cassette |
¯uªÅ·t²° |
|
Vacuum testing |
¯uªÅ检测 |
|
Vacuum cassette |
¯uªÅ·t¦X |
|
Van de Graaff generator |
S¼w®æ³â¤Ò°_电Éó |
|
Vapor pressure |
»]¨T压 |
|
Vapour degreasing |
»]¨T°£ªo |
|
Variable angle probe |
¥i变¨¤±´头 |
|
Vee path |
V«¬¦æµ{ |
|
Vehicle |
载Ê^ |
|
Vertical linearity |
««ª½线©Ê |
|
Vertical location |
««ª½©w¦ì |
|
Visible light |
¥i见¥ú |
|
Vitua limage |
虚°²图¹³ |
|
Voltage threshold |
电压阈È |
|
Voltage threshold |
阈È电压 |
|
Wash station |
¤ô¬~¤u¦ì |
|
Water break test |
¤ô½¤¯}§¥试验 |
|
Water column coupling method |
¤ô¬W½¢¦Xªk |
|
Water column probe |
¤ô¬W½¢¦X±´头 |
|
Water path; water distance |
¤ôµ{ |
|
Water tolerance |
¤ô®e |
|
Water-washable penetrant |
¥i¤ô¬~«¬渗³z剂 |
|
Wave |
ªi |
|
Wave guide acoustic emission |
声发®gªi导§ý |
|
Wave train |
ªi¦C |
|
Wave from |
ªi§Î |
|
Wave front |
ªi«e |
|
Wave length |
ªi长 |
|
Wave node |
ªi节 |
|
Wave train |
ªi¦C |
|
Wedge |
±×·¤ |
|
Wet slurry technique |
湿软ºÏ»I§Þ术 |
|
Wet technique |
湿ªk§Þ术 |
|
Wet method |
湿¯»ªk |
|
Wetting action |
润湿§@¥Î |
|
Wetting action |
润湿§@¥Î |
|
Wetting agents |
润湿剂 |
|
Wheel type probe; wheel search unit |
轮¦¡±´头 |
|
White light |
¥Õ¥ú |
|
White X-rays |
连续X®g线 |
|
Wobble |
摆动 |
|
Wobble effect |
§Ý动®Ä应 |
|
Working sensitivity |
±´伤灵±Ó«× |
|
Wrap around |
残响ªi¤zÊð |
|
Xeroradiography |
静电®g线³z·Ó术 |
|
X-radiation |
X®g线 |
|
X-ray controller |
X®g线±±¨î¾¹ |
|
X-ray detection apparatus |
X®g线±´伤装¸m |
|
X-ray film |
®g线胶¤ù |
|
X-ray paper |
X®g线·P¥ú纸 |
|
X-ray tube |
X®g线ºÞ |
|
X-ray tube diaphragm |
X®g线ºÞ¥ú阑 |
|
Yoke |
ºÏ轭 |
|
Yoke magnetization method |
ºÏ轭ºÏ¤Æªk |
|
Zigzag scan |
锯齿扫¬d |
|
Zone calibration location |
时®t区°ì®Õã©w¦ì |
|
Zone location |
区°ì©w¦ì |
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